IEEE Design & Test

IEEE Design & Test

IEEE DES TEST
影响因子:1.9
是否综述期刊:
是否预警:不在预警名单内
是否OA:
出版国家/地区:UNITED STATES
出版社:IEEE Computer Society
发刊时间:0
发刊频率:
收录数据库:SCIE/Scopus收录
ISSN:2168-2356

期刊介绍

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
IEEE设计与测试提供原创作品,描述用于设计和测试微电子系统的模型、方法和工具,从器件和电路到完整的片上系统和嵌入式软件。该杂志关注当前和近期的实践,包括教程、指导文章和现实世界的案例研究。该杂志通过专栏、访谈和圆桌讨论,不仅向读者介绍重要的技术进步,还介绍技术领导者的观点。主题包括半导体IC设计、半导体知识产权模块、设计、验证和测试技术、制造和产量设计、嵌入式软件和系统、低功耗和节能设计、电子设计自动化工具、实用技术和标准。
年发文量 46
国人发稿量 7.8
国人发文占比 0.17%
自引率 -
平均录取率-
平均审稿周期 -
版面费 -
偏重研究方向 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEERING, ELECTRICAL & ELECTRONIC
期刊官网 https://www.ieee.org/membership-catalog/productdetail/showProductDetailPage.html?product=PER311-EPC
投稿链接

期刊高被引文献

Edge Intelligence—On the Challenging Road to a Trillion Smart Connected IoT Devices
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2899075
Voltage-Driven Building Block for Hardware Belief Networks
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2897964
Survey of Automotive Controller Area Network Intrusion Detection Systems
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2899062
Quantum Computing Circuits and Devices
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2907130
Context-Aware Intelligence in Resource-Constrained IoT Nodes: Opportunities and Challenges
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2899334
OpenHealth: Open-Source Platform for Wearable Health Monitoring
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2906110
Compact Modeling of Thin-Film Transistors for Flexible Hybrid IoT Design
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2899058
Fault-Tolerant Systolic Array Based Accelerators for Deep Neural Network Execution
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2915656
Design of 2T/Cell and 3T/Cell Nonvolatile Memories with Emerging Ferroelectric FETs
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2902094
A Survey on Security Threats and Countermeasures in IEEE Test Standards
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2899064
Design-for-Testability of On-Chip Control in mVLSI Biochips
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2873448
Technological Benchmark of Analog Synaptic Devices for Neuroinspired Architectures
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2890229
Randomized Checkpoints: A Practical Defense for Cyber-Physical Microfluidic Systems
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2863118
The Internet of Tiny Things: Recent Advances of Millimeter-Scale Computing
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2898187
On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2899054
Upgrade/Downgrade: Efficient and Secure Legacy Electronic System Replacement
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2873446
A Survey on Architecture Advances Enabled by Emerging Beyond-CMOS Technologies
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2902359
Security of Emergent Automotive Systems: A Tutorial Introduction and Perspectives on Practice
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2944086
A Highly Integrated Hardware/Software Co-Design and Co-Verification Platform
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2841029
A Diagnosable Network-on-Chip for FPGA Verification of Intellectual Properties
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2890238
SmartPatch: A Self-Powered and Patchable Cumulative UV Irradiance Meter
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2883717
PortLoc: A Portable Data-Driven Indoor Localization Framework for Smartphones
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2906105
Autonomous Design Space Exploration of Computing Systems for Sustainability: Opportunities and Challenges
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2932894
Introducing Hardware-Based Intelligence and Reconfigurability on Industrial IoT Edge Nodes
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2908547
Design of Reversible Arithmetic Logic Unit with Built-In Testability
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2919017
Lessons learned from hacking a car
来源期刊:IEEE Design & TestDOI:10.1109/mdat.2018.2863106
Implications of On-Chip Single-Source Clocking on High-Speed Serial Interfaces in Network SoC
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2910138
Spin-Based Reconfigurable Logic for Power- and Area-Efficient Applications
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2895021
Absolute Energy Routing and Real-Time Power Monitoring for Grid-Connected Distribution Networks
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2897925
Hardware Trojans Inspired IP Watermarks
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2929116
Conference Report from the 2019 International Symposium on Low Power Electronics and Design (ISLPED)
来源期刊:IEEE Design & TestDOI:10.1109/mdat.2019.2941713
56th Design Automation Conference Report
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2942327
Built-In Self-Test/Repair Methodology for Multiband RF-Interconnected TSV 3D Integration
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2932935
Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2908643
Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2865455
Build Your Own EV: A Rapid Energy-Aware Synthesis of Electric Vehicles
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2873452
Pass and Run: A Privacy Preserving Delay Tolerant Network Communication Protocol for CyberVehicles
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2927388
Report of the Fourth International Workshop on Design Automation for Cyber-Physical Systems (DACPS) 2019
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2934361
Challenges and Opportunities in VLSI IoT Devices and Systems
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2917178
The Last Byte: Baseball and Testing
来源期刊:IEEE Design & TestDOI:10.1109/mdat.2019.2942354
Computing with High-Dimensional Vectors
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2018.2890221
Randomization for Safer, more Reliable and Secure, High-Performance Automotive Processors
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2927373
Anomaly Detection and Health-Status Analysis in a Core Router System
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2906108
Intelligent IoT Motes: Preventing Their Abuse at the Weakest Entry Point
来源期刊:IEEE Design & TestDOI:10.1109/MDAT.2019.2898203

质量指标占比

研究类文章占比 OA被引用占比 撤稿占比 出版后修正文章占比
100.00%---

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影响因子
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时间 预警情况
2025年03月发布的2025版不在预警名单中
2024年02月发布的2024版不在预警名单中
2023年01月发布的2023版不在预警名单中
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2020年12月发布的2020版不在预警名单中
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版本 大类学科 小类学科 Top期刊 综述期刊
2025年3月最新升级版
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