Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
《超微显微学》是一本成熟的杂志，为发表原创研究论文、邀请评论和快速交流提供了一个论坛。超显微镜的范围是描述与生命科学和物理科学中的显微成像、衍射和光谱学的所有模式相关的仪器、方法和理论的进展。
Analysis of discrete local variability and structural covariance in macromolecular assemblies using Cryo-EM and focused classification.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.11.016
A multiple scattering algorithm for three dimensional phase contrast atomic electron tomography.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112860
Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.11.011
Time-of-flight secondary ion mass spectrometry in the helium ion microscope.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.12.014
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopes.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112829
Novel remapping approach for HR-EBSD based on demons registration.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112851
Tip wear and tip breakage in high-speed atomic force microscopes.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.03.013
Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross correlation on the sphere.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112836
Extending ζ-factor microanalysis to boron-rich ceramics: Quantification of bulk stoichiometry and grain boundary composition.
来源期刊：UltramicroscopyDOI：10.1016/J.ULTRAMIC.2019.04.008
Estimation of elastic strain by integrated image correlation on electron diffraction patterns.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.02.001
Magnetic measurement by electron magnetic circular dichroism in the transmission electron microscope.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.03.008
The maximum a posteriori probability rule for atom column detection from HAADF STEM images.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.02.003
Beyond imaging: Applications of atomic force microscopy for the study of Lithium-ion batteries.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.05.004
The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.12.004
Significance of electrostatic interactions due to surface potential in piezoresponse force microscopy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112839
Depth-profiling of nickel nanocrystal populations in a borosilicate glass - A combined TEM and XRM study.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.06.004
On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112828
Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.12.016
Capabilities of the Falcon III detector for single-particle structure determination.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.01.002
Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.03.001
Conduction mechanisms and voltage drop during field electron emission from diamond needles.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.03.006
Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112850
Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112928
Phase retrieval with extended field of view based on continuous phase modulation.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.05.002
Visualization of three different phases in a multiphase steel by scanning electron microscopy at 1\u202feV landing energy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.04.014
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.09.008
Towards large scale orientation mapping using the eCHORD method.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112854
Prospects of annular differential phase contrast applied for optical sectioning in STEM.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.09.012
Disentangling topographic contributions to near-field scanning microwave microscopy images.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.11.003
Pulse picking in synchrotron-based XPEEM.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.03.011
Extremely low count detection for EELS spectrum imaging by reducing CCD read-out noise.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112827
A 0.5-T pure-in-plane-field magnetizing holder for in-situ Lorentz microscopy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.11.012
Influence of pixelization on height measurement in atomic force microscopy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112846
A comparison of two high spatial resolution imaging techniques for determining carbide precipitate type and size in ferritic 9Cr-1Mo steel.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.06.005
Continued skirmishing on the wave-particle frontier.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.01.006
The design and the performance of an ultrahigh vacuum 3He fridge-based scanning tunneling microscope with a double deck sample stage for in-situ tip treatment.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.10.008
The mechanism of nanoparticle precipitation induced by electron irradiation in transmission electron microscopy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.09.009
Mesoscopic quantitative chemical analyses using STEM-EDX in current and next generation polycrystalline Ni-based superalloys.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.04.015
Design for a high resolution electron energy loss microscope.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112848
Observation of surface step bunch induced perpendicular magnetic anisotropy using spin-polarized low energy electron microscopy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.02.025
Design and application of a relativistic Kramers-Kronig analysis algorithm.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112825
Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductors.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.04.013
On the residual six-fold astigmatism in DCOR/ASCOR.
来源期刊：UltramicroscopyDOI：10.1016/J.ULTRAMIC.2019.112821
Multi-modal and multi-scale non-local means method to analyze spectroscopic datasets.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.112877
Geometry determination and refinement in the rotation electron diffraction technique.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.02.011
Correlative study of lattice imperfections in long-range ordered, nano-scale domains in a Fe-Co-Mo alloy.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.05.005
Longevity in electron optics- Introduction to the Howie-Colliex-Lichte birthday issue.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2018.11.001
Beam brightness and its reduction in a 1.2-MV cold field-emission transmission electron microscope.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.04.002
Data-driven computational method for determining accurate analytical field solutions on arbitrary-geometry spectrometers.
来源期刊：UltramicroscopyDOI：10.1016/J.ULTRAMIC.2019.04.003
Fluctuations of focused electron beam in a conventional SEM.
来源期刊：UltramicroscopyDOI：10.1016/j.ultramic.2019.05.008
